linux_dsm_epyc7002/drivers/mtd/tests
Miquel Raynal 12663b442e mtd: mtd_oobtest: Handle bitflips during reads
Reads from NAND devices usually trigger bitflips, this is an expected
behavior. While bitflips are under a given threshold, the MTD core
returns 0. However, when the number of corrected bitflips is above this
same threshold, -EUCLEAN is returned to inform the upper layer that this
block is slightly dying and soon the ECC engine will be overtaken so
actions should be taken to move the data out of it.

This particular condition should not be treated like an error and the
test should continue.

Signed-off-by: Miquel Raynal <miquel.raynal@free-electrons.com>
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
2018-01-12 10:24:08 +01:00
..
Makefile License cleanup: add SPDX GPL-2.0 license identifier to files with no license 2017-11-02 11:10:55 +01:00
mtd_nandecctest.c mtd: nand: tests: fix regression introduced in mtd_nandectest 2016-03-04 16:59:20 -08:00
mtd_test.c License cleanup: add SPDX GPL-2.0 license identifier to files with no license 2017-11-02 11:10:55 +01:00
mtd_test.h License cleanup: add SPDX GPL-2.0 license identifier to files with no license 2017-11-02 11:10:55 +01:00
nandbiterrs.c mtd: tests: nandbiterrs: Fix read_page return value 2018-01-09 10:56:29 +01:00
oobtest.c mtd: mtd_oobtest: Handle bitflips during reads 2018-01-12 10:24:08 +01:00
pagetest.c mtd: tests: consolidate kmalloc/memset 0 call to kzalloc 2016-01-06 15:17:42 -08:00
readtest.c mtd: readtest: don't clobber error reports 2015-05-14 09:56:31 -07:00
speedtest.c mtd: tests: Replace timeval with ktime_t 2015-10-26 13:23:47 -07:00
stresstest.c mtd: Make MTD tests cancelable 2015-04-05 18:12:53 -07:00
subpagetest.c mtd: subpagetest: fix wrong written check in function write_eraseblock2 2017-06-08 16:39:21 -07:00
torturetest.c mtd: tests: Replace timeval with ktime_t 2015-10-26 13:23:47 -07:00