The PowerNV PCI hotplug driver is going to use the OF changeset
to manage the changed device sub-tree. This exports those OF
changeset functions for that.
Signed-off-by: Gavin Shan <gwshan@linux.vnet.ibm.com>
Acked-by: Wolfram Sang <wsa+renesas@sang-engineering.com>
Tested-by: Wolfram Sang <wsa+renesas@sang-engineering.com>
Signed-off-by: Rob Herring <robh@kernel.org>
Add a single resource to the test bus device to exercise the platform
bus code a little more. This isn't strictly a devicetree test, but it is
a corner case that the devicetree runs into. Until we've got platform
device unittests, it can live here. It doesn't need to be an explicit
text because the kernel will oops when it is wrong.
Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Cc: Rob Herring <robh@kernel.org>
Cc: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
Cc: Ricardo Ribalda Delgado <ricardo.ribalda@gmail.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
[wsa: added the comment provided by Grant, rebased, and tested]
Signed-off-by: Wolfram Sang <wsa+renesas@sang-engineering.com>
Signed-off-by: Rob Herring <robh@kernel.org>
for_each_child_of_node performs an of_node_get on each iteration, so
a break out of the loop requires an of_node_put.
A simplified version of the semantic patch that fixes this problem is as
follows (http://coccinelle.lip6.fr):
// <smpl>
@@
expression root,e;
local idexpression child;
@@
for_each_child_of_node(root, child) {
... when != of_node_put(child)
when != e = child
(
return child;
|
+ of_node_put(child);
? return ...;
)
...
}
// </smpl>
Combine the puts into code at the end of the function, for conciseness.
Signed-off-by: Julia Lawall <Julia.Lawall@lip6.fr>
Signed-off-by: Rob Herring <robh@kernel.org>
platform_driver and i2c_driver do not need to set an owner because core
will set it.
Signed-off-by: Krzysztof Kozlowski <k.kozlowski@samsung.com>
Signed-off-by: Rob Herring <robh@kernel.org>
- DT endianness specification bindings
- Big endian 8250 serial support
- DT overlay unittest updates
- Various DT doc updates
- Compile fixes for OF_IRQ=n
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Merge tag 'devicetree-for-4.1' of git://git.kernel.org/pub/scm/linux/kernel/git/robh/linux
Pull second batch of devicetree updates from Rob Herring:
"As Grant mentioned in the first devicetree pull request, here is the
2nd batch of DT changes for 4.1. The main remaining item here is the
endianness bindings and related 8250 driver support.
- DT endianness specification bindings
- big-endian 8250 serial support
- DT overlay unittest updates
- various DT doc updates
- compile fixes for OF_IRQ=n"
* tag 'devicetree-for-4.1' of git://git.kernel.org/pub/scm/linux/kernel/git/robh/linux:
frv: add io{read,write}{16,32}be functions
mn10300: add io{read,write}{16,32}be functions
Documentation: DT bindings: add doc for Altera's SoCFPGA platform
of: base: improve of_get_next_child() kernel-doc
Doc: dt: arch_timer: discourage clock-frequency use
of: unittest: overlay: Keep track of created overlays
of/fdt: fix allocation size for device node path
serial: of_serial: Support big-endian register accesses
serial: 8250: Add support for big-endian MMIO accesses
of: Document {little,big,native}-endian bindings
of/fdt: Add endianness helper function for early init code
of: Add helper function to check MMIO register endianness
of/fdt: Remove "reg" data prints from early_init_dt_scan_memory
of: add vendor prefix for Artesyn
of: Add dummy of_irq_to_resource_table() for IRQ_OF=n
of: OF_IRQ should depend on IRQ_DOMAIN
During the course of the overlay selftests some of them remain
applied. While this does not pose a real problem, make sure you track
them and destroy them at the end of the test.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Rob Herring <robh@kernel.org>
The previous commit, "of/unittest: early return from test skips tests"
exposed broken tests for the of_platform_unpopulate() function. The
problem was the populate and depopulate calls were not symmetrical like
they were intended to be, and unpopulate depends on the parent device to
have it's of_node pointer pointing to the parent device node. Fix these
bugs so that the test case works correctly.
In the process, the test_bus used as a container for the test devices
has been changed from a statically allocated struct device (which is
bad) to a properly allocated device with a .release() method (which is
good). This stops the test code from being a bad example of abusing the
device model.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Cc: Frank Rowand <frank.rowand@sonymobile.com>
Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Cc: Pawel Moll <pawel.moll@arm.com>
Fix bugs pointed out by checkpatch: Mis-coding of two if statements
caused early return from function.
Number of tests completed increased from 102 to 107.
Number of tests failed increased from 0 to 2.
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Fix warnings pointed out by checkpatch.
Checkpatch warns: externs should be avoided in .c files
Reducing pain for future maintainers - adding a comment so that anyone trying
to find where the extern data is created will be able to find it.
(grep will not find that location)
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Fix warnings pointed out by checkpatch.
No bug fixes, but reduce the number of checkpatch warnings so that future
problems will stand out better.
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Fix bug pointed out by checkpatch.
Splitting string incorrectly removed a space between two words.
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Fix warnings pointed out by checkpatch.
No bugs fixed, but the test code should be a good example of how to use
the devicetree API.
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
This patch just replace the string 'selftest' with 'unittest'
in OF unittest and data and binding file.
I have tested it successfully on ARM.
Signed-off-by: Wang Long <long.wanglong@huawei.com>
Signed-off-by: Rob Herring <robh@kernel.org>
There were regressions seen with commit 106937e8cc ("of: fix handling
of '/' in options for of_find_node_by_path()"), where we couldn't handle
extra '/' before the ':'. Let's test for this now.
Confirmed that this test fails without the previous patch and passes
when patched. All other tests pass.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Acked-by: Leif Lindholm <leif.lindholm@linaro.org>
Signed-off-by: Rob Herring <robh@kernel.org>
Add testcase variants with '/' in the options string to test for
scan beyond end path name terminated by ':'.
Signed-off-by: Peter Hurley <peter@hurleysoftware.com>
Signed-off-by: Rob Herring <robh@kernel.org>
This patch fix the wrong expected value of of_property_match_string
in of_selftest_property_string.
Signed-off-by: Wang Long <long.wanglong@huawei.com>
Signed-off-by: Rob Herring <robh@kernel.org>
Remove the duplicate of_changeset_init. In of_selftest_changeset
testcase, the "struct of_changeset chgset" is initialized twice,
but only once is enough. so, drop the first initializtion code.
Signed-off-by: Wang Long <long.wanglong@huawei.com>
Signed-off-by: Rob Herring <robh@kernel.org>
The unittest fails to link if I2C or I2C_MUX is a loadable module:
drivers/built-in.o: In function `selftest_i2c_mux_remove':
unittest.c:(.text+0xb0ce4): undefined reference to `i2c_del_mux_adapter'
This changes the newly added IS_ENABLED() checks to use IS_BUILTIN()
instead, which evaluates to false if the other driver is a module.
Reported-by: Chen Gang <gang.chen.5i5j@gmail.com>
Signed-off-by: Arnd Bergmann <arnd@arndb.de>
Fixes: d5e75500ca ("of: unitest: Add I2C overlay unit tests.")
Signed-off-by: Rob Herring <robh@kernel.org>
Introduce I2C device tree overlay tests.
Tests insertion and removal of i2c adapters, i2c devices, and muxes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Rob Herring <robh@kernel.org>
Introduce selftests for overlays using sub-devices present
in children nodes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Commit 3ce04b4a9, "Removes OF_UNITTEST dependency on OF_DYNAMIC config
symbol" removes a bunch of code, but missed a few minor bits. Clean it
up by removing the node removal cache and flag.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Cc: Gaurav Minocha <gaurav.minocha.os@gmail.com>
Cc: Rob Herring <robh@kernel.org>
This patch intends to remove the unittests dependency on
the functions defined in dynamic.c. So, rather than calling
of_attach_node defined in dynamic.c, minimal functionality
required to attach a new node is re-defined in unittest.c.
Also, now after executing the tests the test data is not
removed from the device tree so there is no need to call
of_detach_node.
Tested with and without OF_DYNAMIC enabled on ppc, arm and
x86
Signed-off-by: Gaurav Minocha <gaurav.minocha.os@gmail.com>
Signed-off-by: Rob Herring <robh@kernel.org>
The of_node_put() function tests whether its argument is NULL and then
returns immediately. Thus the test around the call is not needed.
This issue was detected by using the Coccinelle software.
Signed-off-by: Markus Elfring <elfring@users.sourceforge.net>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Update of_find_node_by_path():
1) Rename function to of_find_node_opts_by_path(), adding an optional
pointer argument. Provide a static inline wrapper version of
of_find_node_by_path() which calls the new function with NULL as
the optional argument.
2) Ignore any part of the path beyond and including the ':' separator.
3) Set the new provided pointer argument to the beginning of the string
following the ':' separator.
4: Add tests.
Signed-off-by: Leif Lindholm <leif.lindholm@linaro.org>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
The unittest code has a MODULE_DEVICE_TABLE that isn't needed by any of
the unittests, and isn't even correct. Remove it.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Add unittests for OF overlays.
It tests overlay device addition/removal and whether
the apply revert sequence is correct.
Changes since V1:
* Added local fixups entries.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Add a node argument to __of_node_alloc() and rename it to
__of_node_dup() so that it can also be used to duplicate a node with
its properties. This is important for the overlay code so that it can
create new nodes without using separate changeset items for every single
property.
At the same time rework the overlay code to use the new function and
drop the extra changeset items.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
The overlay code needs to construct a new full_name from the parent name
and the node name, but the current method has to allocate and then free
an temporary string which is wasteful. Fix this problem by using vargs
to pass in a format and arguments into __of_node_alloc().
At the same time remove the allocflags argument to __of_node_alloc().
The only users all use GFP_KERNEL, so there is no need to provide it as
an option. If there is ever a need later it can be added back.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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Merge tag 'v3.18-rc6' into devicetree/next
v3.18-rc6 contains an important DT bug fix, c1a2086e2d, "of/selftest:
Fix off-by-one error in removal path" which affects testing of the
overlay patch series. Merge it into the devicetree/next staging branch
so that the overlay patches are applied on top of a known working tree.
Linux 3.18-rc6
Conflicts:
drivers/of/address.c
This is unit testing code. It should use that name because it makes more
sense than 'selftest'. Rename the files to match and rename the config
variable.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
