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of/unittest: Swap arguments of of_unittest_apply_overlay()
Function signature of_unittest_apply_overlay(int unittest_nr, int overlay_nr, ... and call sites, like in of_unittest_apply_overlay_check(): ret = of_unittest_apply_overlay(overlay_nr, unittest_nr, ... do not match. Fix this in one place (function signature). The only affected test case is 15, which supplies non-existing overlay number 16, but two bugs matched here. Fix the test case. Signed-off-by: Alexander Sverdlin <alexander.sverdlin@nokia.com> Cc: Rob Herring <robh+dt@kernel.org> Cc: Frank Rowand <frowand.list@gmail.com> Cc: devicetree@vger.kernel.org Signed-off-by: Rob Herring <robh@kernel.org>
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@ -1180,7 +1180,7 @@ static void of_unittest_destroy_tracked_overlays(void)
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} while (defers > 0);
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}
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static int of_unittest_apply_overlay(int unittest_nr, int overlay_nr,
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static int of_unittest_apply_overlay(int overlay_nr, int unittest_nr,
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int *overlay_id)
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{
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struct device_node *np = NULL;
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@ -1839,7 +1839,7 @@ static void of_unittest_overlay_i2c_15(void)
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int ret;
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/* device should enable */
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ret = of_unittest_apply_overlay_check(16, 15, 0, 1, I2C_OVERLAY);
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ret = of_unittest_apply_overlay_check(15, 15, 0, 1, I2C_OVERLAY);
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if (ret != 0)
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return;
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