linux_dsm_epyc7002/drivers/gpu/drm/i915/i915_selftest.h

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drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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/*
* Copyright © 2016 Intel Corporation
*
* Permission is hereby granted, free of charge, to any person obtaining a
* copy of this software and associated documentation files (the "Software"),
* to deal in the Software without restriction, including without limitation
* the rights to use, copy, modify, merge, publish, distribute, sublicense,
* and/or sell copies of the Software, and to permit persons to whom the
* Software is furnished to do so, subject to the following conditions:
*
* The above copyright notice and this permission notice (including the next
* paragraph) shall be included in all copies or substantial portions of the
* Software.
*
* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
* THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
* LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING
* FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS
* IN THE SOFTWARE.
*/
#ifndef __I915_SELFTEST_H__
#define __I915_SELFTEST_H__
#include <linux/types.h>
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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struct pci_dev;
struct drm_i915_private;
struct i915_selftest {
unsigned long timeout_jiffies;
unsigned int timeout_ms;
unsigned int random_seed;
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-30 01:54:49 +07:00
char *filter;
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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int mock;
int live;
int perf;
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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};
#if IS_ENABLED(CONFIG_DRM_I915_SELFTEST)
#include <linux/fault-inject.h>
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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extern struct i915_selftest i915_selftest;
int i915_mock_selftests(void);
int i915_live_selftests(struct pci_dev *pdev);
int i915_perf_selftests(struct pci_dev *pdev);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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/* We extract the function declarations from i915_mock_selftests.h and
* i915_live_selftests.h Add your unit test declarations there!
*
* Mock unit tests are run very early upon module load, before the driver
* is probed. All hardware interactions, as well as other subsystems, must
* be "mocked".
*
* Live unit tests are run after the driver is loaded - all hardware
* interactions are real.
*/
#define selftest(name, func) int func(void);
#include "selftests/i915_mock_selftests.h"
#undef selftest
#define selftest(name, func) int func(struct drm_i915_private *i915);
#include "selftests/i915_live_selftests.h"
#include "selftests/i915_perf_selftests.h"
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#undef selftest
struct i915_subtest {
int (*func)(void *data);
const char *name;
};
int __i915_nop_setup(void *data);
int __i915_nop_teardown(int err, void *data);
int __i915_live_setup(void *data);
int __i915_live_teardown(int err, void *data);
int __intel_gt_live_setup(void *data);
int __intel_gt_live_teardown(int err, void *data);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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int __i915_subtests(const char *caller,
int (*setup)(void *data),
int (*teardown)(int err, void *data),
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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const struct i915_subtest *st,
unsigned int count,
void *data);
#define i915_subtests(T, data) \
__i915_subtests(__func__, \
__i915_nop_setup, __i915_nop_teardown, \
T, ARRAY_SIZE(T), data)
#define i915_live_subtests(T, data) ({ \
typecheck(struct drm_i915_private *, data); \
__i915_subtests(__func__, \
__i915_live_setup, __i915_live_teardown, \
T, ARRAY_SIZE(T), data); \
})
#define intel_gt_live_subtests(T, data) ({ \
typecheck(struct intel_gt *, data); \
__i915_subtests(__func__, \
__intel_gt_live_setup, __intel_gt_live_teardown, \
T, ARRAY_SIZE(T), data); \
})
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#define SUBTEST(x) { x, #x }
#define I915_SELFTEST_DECLARE(x) x
#define I915_SELFTEST_ONLY(x) unlikely(x)
#else /* !IS_ENABLED(CONFIG_DRM_I915_SELFTEST) */
static inline int i915_mock_selftests(void) { return 0; }
static inline int i915_live_selftests(struct pci_dev *pdev) { return 0; }
static inline int i915_perf_selftests(struct pci_dev *pdev) { return 0; }
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#define I915_SELFTEST_DECLARE(x)
#define I915_SELFTEST_ONLY(x) 0
#endif
/* Using the i915_selftest_ prefix becomes a little unwieldy with the helpers.
* Instead we use the igt_ shorthand, in reference to the intel-gpu-tools
* suite of uabi test cases (which includes a test runner for our selftests).
*/
#define IGT_TIMEOUT(name__) \
unsigned long name__ = jiffies + i915_selftest.timeout_jiffies
__printf(2, 3)
bool __igt_timeout(unsigned long timeout, const char *fmt, ...);
#define igt_timeout(t, fmt, ...) \
__igt_timeout((t), KERN_DEBUG pr_fmt(fmt), ##__VA_ARGS__)
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#endif /* !__I915_SELFTEST_H__ */